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    List of Articles V P CHANDRA SEKHAR YADAV GAMPA


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    1 - Defect Detection using Depth Resolvable Statistical Post Processing in Non-Stationary Thermal Wave Imaging
    Journal of Information Systems and Telecommunication (JIST) , Iss.  2 , Year , Spring 2022
    Defects that are generated during various phases of manufacturing or transporting limit the future applicability and serviceability of materials. In order to detect these defects a non-destructive testing modality is required. Depth resolvable subsurface anomaly detecti Full Text
    Defects that are generated during various phases of manufacturing or transporting limit the future applicability and serviceability of materials. In order to detect these defects a non-destructive testing modality is required. Depth resolvable subsurface anomaly detection in non-stationary thermal wave imaging is a vital outcome for a reliable prominent investigation of materials due to its fast, remote and non-destructive features. The present work solves the 3-Dimensional heat diffusion equation under the stipulated boundary conditions using green’s function based analytical approach for recently introduced quadratic frequency modulated thermal wave imaging (with FLIR SC 655A as infrared sensor with spectral range of 7.5-14µm and 25 fps) to explore the subsurface details with improved sensitivity and resolution. The temperature response obtained by solving the 3-Dimensional heat diffusion equation is used along with random projection-based statistical post-processing approach to resolve the subsurface details by imposing a band of low frequencies (0.01-0.1 Hz) over a carbon fiber reinforced polymer for experimentation and extracting orthonormal projection coefficients to improve the defect detection with enhanced depth resolution. Orthonormal projection coefficients are obtained by projecting the orthonormal features of the random vectors that are extracted by using Gram-Schmidt algorithm, on the mean removed dynamic thermal data. Further, defect detectability of random projection-based post-processing approach is validated by comparing the full width at half maxima (FWHM) and signal to noise ratio (SNR) of the processed results of the conventional approaches. Random projection provides detailed visualization of defects with 31% detectability even for deeper and small defects in contrast to conventional post processing modalities. Additionally, the subsurface anomalies are compared with their sizes based on full width at half maxima (FWHM) with a maximum error of 0.99% for random projection approach. Manuscript Document